AM Explorer - Designed for metal AM
Transform monitoring data to insights
Understand your AM process and save resources
The Problem
To improve and industrialize the AM process the industry needs to capture, explore and understand large amounts of data from the entire manufacturing process.
Our Solution
We developed AM Explorer specifically for the metal AM market. AM Explorer enables users to explore and understand the data they collect, regardless what systems and sensors they use.
The Benefits
AM Explorer makes it easier for users to explore and understand their process data, leading to:
- Reduced manufacturing costs
- Improved quality
- Faster application development
- Less trial and error
Designed by and for the metal AM Industry
A flexible software with many applications
Anomaly detection
Detection of process abnormalities and part defects.
Anomaly analysis
Comparison
Correlation analysis
Presentation & Communication
Training & Education
Correlation between Optical Tomography data and a displacement simulation.
Optical Tomography data in 3D
AR Demo showing hot spot indications
Design files combined with powder bed images, a static load simulation and a graphs indicating possible errors.
CT scan fused with machine monitoring data.